X-Rite Ci?52 Versatile Spectrophotometer
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Product Description
A versatile instrument for consistent measurement of a wide variety of samples in a range of materials, sizes, shapes, textures, and opacity levels.
Simultaneous measurement of both color and appearance
enhances accuracy. The unit can be used as a tethered handheld device or mounted for small footprint benchtop use. A NetProfiler3-enabled system ensures consistent, precise performance.
Measuring Geometrics:
d/8°, DRS spectral engine Simultaneous SPIN / SPEX
Optical Aperture:
8mm measurement area 14mm target window
Light Source: Gas-filled tungsten lamp
Receiver: Blue-enhanced silicon photodiodes
Spectral Range: 400 – 700nm
Spectral Interval: 10nm – measured 10nm – output
Measurement Range: 0 to 200% reflectance
Measuring Time: Approx. 2 seconds
Inter-Instrument Agreement:
CIE L*a*b*: Avg. 0.20 ΔE*ab based on avg. of 12 BCRA Series II tiles (specular component included) Max.
0.40 ΔE*ab on any tile (specular component included)
Short-Term Repeatability: .05 ΔE*ab on white ceramic
NetProfiler Support: Embedded
Transform Support: Embedded
Lamp Life: Approx. 500,000 measurements
Power Supply: AC Adapter Requirements 90 –130VAC or 100 – 240VAC, 50 – 60Hz, 15W max
Data Interface: USB
Operating Temperature Range:
50° to 104°F (10° to 40°C) 85% relative humidity maximum (non-condensing)
Storage Temperature Range: -4° to 122°F (-20° to 50°C)
Weight: 1.9 lbs. (.87 kg)
Dimensions: 4.3”H (10.9 cm) x 3.6”W (9.1 cm) x 8.4”L (21.3 cm)
Accessories Provided:
Calibration standards: Black trap removable white & green standards,operations manual, AC adapter,USB cable with strain relief
Options:
Optional benchtop stand sample presentation fixtures
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